Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration

Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration voorzijde
Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration achterzijde
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This book focuses on the design, materials, process, fabrication, quality, reliability, fatigue, fracture, and artificial intelligence (AI) assisted in chiplets and heterogeneous integration. Both principles and engineering practice have been addressed, with more emphasis placed on engineering practice. This is achieved by providing in-depth study on a number of major topics such as Cu interconnects, glass-core substrate, 3D heterogeneous integration of photonic IC and electronic IC, and combining simulation design with AI technology to effectively apply it to semiconductor packaging. This book can benefit researchers, engineers, and graduate students in fields of electrical engineering, mechanical engineering, materials sciences, and industry engineering, etc.

Specificaties
ISBN/EAN 9789819568901
Auteur John Lau
Uitgever Van Ditmar Boekenimport B.V.
Taal Engels
Uitvoering Gebonden in harde band
Pagina's 548
Lengte
Breedte

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