Ionizing Radiation Effects In Mos Oxides
As a result of work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation, the understanding of the basic physical mechanisms has evolved. This text summarizes the new work and integrates it with older work to form a unified picture.
Specificaties
| ISBN/EAN | 9789810233266 |
| Auteur | Timothy R (Us Army Research Lab Oldham |
| Uitgever | Van Ditmar Boekenimport B.V. |
| Taal | Engels |
| Uitvoering | Gebonden in harde band |
| Pagina's | 188 |
| Lengte | |
| Breedte |
