Ionizing Radiation Effects In Mos Oxides

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As a result of work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation, the understanding of the basic physical mechanisms has evolved. This text summarizes the new work and integrates it with older work to form a unified picture.

Specificaties
ISBN/EAN 9789810233266
Auteur Timothy R (Us Army Research Lab Oldham
Uitgever Van Ditmar Boekenimport B.V.
Taal Engels
Uitvoering Gebonden in harde band
Pagina's 188
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