ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Specificaties
| ISBN/EAN | 9781627081504 |
| Auteur | ASM International |
| Uitgever | Van Ditmar Boekenimport B.V. |
| Taal | Engels |
| Uitvoering | Paperback / gebrocheerd |
| Pagina's | 660 |
| Lengte | |
| Breedte |