Statistical Methods for Materials Science
The Data Science of Microstructure Characterization
This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling.
Specificaties
ISBN/EAN | 9780367780289 |
Auteur | Simmons, Jeffrey P. (Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio, USA) |
Uitgever | Van Ditmar Boekenimport B.V. |
Taal | Engels |
Uitvoering | Paperback / gebrocheerd |
Pagina's | 514 |
Lengte | |
Breedte |